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High Resolution Electron Microscopy of Defects in Materials: Symposium Held April 16-18, 1990, San Francisco, California, U.S.A. (Materials Research, 183)
Robert Sinclair , David J. Smith , Ulrich Dahmen
/ Materials Research Society 1990
391 pp., hardcover, ex library, else text clean & binding tight. Volumes
Included: 1
ISBN: 1558990720
Subject/Keywords: dpt Microscopy
Item #: 404605
$5.01