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Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Nicolici, Nicola, Al-Hashimi, Bashir M.
/ Kluwer 2003
178 pp., Hardcover, ex library else text clean and binding tight. Volumes
Included: 1
ISBN: 140207235X
Subject/Keywords: ntt physics
Item #: 1126153
$39.05