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Scanned Probe Microscopy. AIP Conference Proceedings, No. 241
Wickramasinghe, H. Kumar, ed.
/ American Institute of Physics 1992
563 pp., hardcover, small hand stamp to front free endpaper else fine. Volumes
Included: 1
ISBN: 0883188163
Subject/Keywords: Scanned Probe Microscopy
Item #: 1181588
$11.74