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Active Probe Atomic Force Microscopy: A Practical Guide on Precision Instrumentation
Xia, Fangzhou, Rangelow, Ivo W., Youcef-Toumi, Kamal
/ Springer 2024
390 pp., hardcover, light bump to top corner of the front cover, else fine. Volumes
Included: 1
ISBN: 3031442326
Subject/Keywords: apd microscopy atomic force
Item #: 1311844
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$90.41